主管:中华人民共和国应急管理部
主办:应急管理部天津消防研究所
ISSN 1009-0029  CN 12-1311/TU

消防科学与技术 ›› 2025, Vol. 44 ›› Issue (10): 1479-1485.

• • 上一篇    下一篇

配电箱接触不良引发发光连接的动态变化

王林, 葛达辉, 赵艳红, 李阳   

  1. (中国人民警察大学 物证鉴定中心,河北 廊坊 065000)
  • 收稿日期:2025-06-03 修回日期:2025-08-26 出版日期:2025-10-23 发布日期:2025-10-15
  • 作者简介:王 林,中国人民警察大学硕士研究生,主要从事安全工程、火灾调查等方面的研究,河北省廊坊市安次区西昌路220号,065000。
  • 基金资助:
    国家重点研发计划项目(2023YFC3009803);中国人民警察大学研究生科技创新计划(YJSKC2431)

Dynamic change of luminous connection caused by poor contact of distribution box

Wang Lin, Ge Dahui, Zhao Yanhong, Li Yang   

  1. (Physical Evidence Appraisal Center, China People's Police University, Langfang Hebei 065000, China)
  • Received:2025-06-03 Revised:2025-08-26 Online:2025-10-23 Published:2025-10-15

摘要: 为探究配电箱零排接线端子接触不良所引发的发光连接现象及其温升规律,本研究构建了可模拟接触不良状态的试验平台,系统开展了不同电流与扭矩条件下接线端子‒导线体系的温升试验,揭示了发光连接过程中的温度变化特征与导线宏观形态演变机制。通过控制电流大小与紧固扭矩以模拟不同程度接触不良,对温升过程及表观变化进行了观测与记录。结果表明,发光连接形成后的温升可分为2个典型阶段,且在不同条件下导线宏观变化特征一致;接触不良与电流共同显著影响发热程度:较小电流下接触不良即可引发发光连接,而大电流下温升急剧,火灾危险性显著增大,电气保护装置在该类故障下常无法及时动作,进一步增加火灾风险。本研究明确了接触不良引发端子发热的核心特征与风险机制,为配电箱系统的火灾预警与安全防护提供了试验与理论支撑,对提升配电系统在设计、维护过程中对接触不良类故障的监测与预防能力具有重要价值,并为后续多变量耦合条件下的发光连接研究奠定了基础。

关键词: 接触不良, 发光连接, 宏观变化, 火灾风险

Abstract: In order to explore the phenomenon of luminous connection caused by poor contact of terminal zero of distribution box and its temperature rise law, an experimental platform was built to simulate the poor contact state, and the temperature rise experiments of terminal-conductor system under different current and torque conditions were carried out systematically, revealing the temperature change characteristics and the macro-morphological evolution mechanism of conductor during luminous connection. By controlling the current and tightening torque to simulate different degrees of poor contact, the temperature rise process and apparent changes were observed and recorded. The results show that the temperature rise after the formation of luminescent connection can be divided into two typical stages, and the macro-change characteristics of the conductor are consistent under different conditions. Poor contact and current significantly affect the degree of heating: poor contact can lead to luminous connection at a small current, while the temperature rises sharply at a large current, which significantly increases the fire risk, and the electrical protection device often fails to act in time under such faults, further increasing the fire risk. This study clarifies the core characteristics and risk mechanism of terminal heating caused by poor contact, which provides experimental and theoretical support for fire warning and safety protection of distribution box system, and is of great value to improve the monitoring and prevention ability of poor contact faults in the design and maintenance of distribution system, and lays the foundation for the subsequent research on luminous connection under multivariable coupling conditions.

Key words: poor contact, luminous connection, macroscopic changes, fire risk