主管：中华人民共和国应急管理部
主办：应急管理部天津消防研究所
ISSN 1009-0029  CN 12-1311/TU
消防科学与技术

消防科学与技术 ›› 2021, Vol. 40 ›› Issue (6): 932-935.

• • 上一篇    下一篇

铝合金导线过电流熔痕微观形貌特征

张金宝1，向熠堃2，周广英3，李阳4   

  1. 1. 黑龙江省消防救援总队，黑龙江哈尔滨150001；2. 许昌市消防救援支队，河南许昌461000；3. 大庆市消防救援支队，黑龙江大庆163000；4. 中国人民警察大学，河北廊坊065000<
  • 出版日期:2021-06-15 发布日期:2021-06-15
  • 通讯作者: 李阳（1986-），男，中国人民警察大学侦查学院副教授。
  • 作者简介:张金宝（1967-），男，黑龙江省消防救援总队火调技术处高级工程师，主要从事火灾事故调查工作，黑龙江省哈尔滨市南岗区长江路366 号，150001。

Microstructure characteristics of overcurrent melt trace of aluminum alloy wire

ZHANG Jin-bao1, XIANG Yi-kun2, ZHOU Guang-ying3 , LI Yang4   

  1. 1. Heilongjinag Fire and Rescue Brigade, Heilongjiang Harbin 150001, China; 2. Xuchang Fire and Rescue Division, Henan Xuchang 461000, China; 3. Daqing Fire and Rescue Division, Heilongjiang Daqing 163000, China; 4. China People's Police University, Hebei Langfang 065000, China
  • Online:2021-06-15 Published:2021-06-15

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摘要： 为判断线路发生过电流时电弧故障点位置，模拟不同过电流条件下AA8030 型铝合金导线的过电流故障，通过场发射电子扫描显微镜分析导线过电流不同区域熔痕微观形貌特征。结果表明：电弧熔断点处熔痕标志性微观形貌特征为蜂窝状和雪花状痕迹；非电弧作用区域熔痕标志性微观形貌特征为针叶状痕迹；电弧熔断点外侧熔渣区标志性微观形貌特征为球状痕迹。该结论可为调查人员判断过电流电弧故障点提供参考。

关键词: 电气火灾, 铝合金导线, 过电流, 熔化痕迹, 扫描电镜

Abstract: In order to determine the location of the arc fault point when the line overcurrent occurs, the overcurrent faults of AA8030 aluminum alloy wire under different overcurrent conditions are simulated, and the microstructure characteristics of the melt marks in different areas of overcurrent of the wire are analyzed by field emission scanning electron microscope. The results show that the micromorphological characteristics of the melting marks at the arc fusion point are honeycomb and snowflake. The signature micro morphology of the fusion mark in the non- arc area is the needle- shaped trace. The characteristic microscopic appearance of the slag area outside the arc melting point is spherical trace. This conclusion can provide reference for investigators to judge the fault point of overcurrent arc.

Key words: electrical fire, aluminum alloy conductors, overcurrent, melt trace, scanning electron microscopy